Click here to go to a list of abstracts for these articles.

• David A. Hanson, Ronald J. G. Goossens, Mark Redford, Jim McGinty, John K. Kibarian, and Kimon W. Michaels, "Analysis of Mixed-Signal Manufacturability with Statistical Technology CAD (TCAD)", IEEE Transactions on Semiconductor Manufacturing, Vol. 9, No. 4, November 1996, pp. 478-488.
• Khaled Hasnat, Suhail Murtaza, and Al F. Tasch, Jr., "A Manufacturing Sensitivity Analysis of 0.35 micrometer LDD MOSFET's", IEEE Transactions on Semiconductor Manufacturing, Vol. 7, No. 1, February 1994, pp. 53-59.
• Jye-Chyi Lu, William C. Holton, Joel S. Fenner, Stewart C. Williams, Ki Wook Kim, Alan H. Hartford, Di Chen, Ksenia Roze, and Michael A. Littlejohn, "A New Device Design Methodology for Manufacturability" IEEE Transactions on Electron Devices: Special Issue on Process Integration and Manufacturability Vol. 45, No. 3, pp. 634-642, 1998.
• Purnendu K. Mozumder and Amitava Chatterjee, "A Statistical Methodology as Applied to a 256 Mbit DRAM Pass Transistor Design", IEEE Transactions on Semiconductor Manufacturing, Vol. 9, No. 3, August 1996, pp. 437-446.
• Sani R. Nassif, Andrzej J. Strojwas, and Stephen W. Director, "A Methodology for Worst-Case Analysis of Integrated Circuits", IEEE Transactions on Computer-Aided Design, Vol. CAD-5, No. 1, January 1986, pp. 104-113.
• Thomas J. Sanders, Kamel Rekab, Francis M. Rotella, and Dale P. Means, "Integrated Circuit Design for Manufacturing Through Statistical Simulation of Process Steps", IEEE Transactions on Semiconductor Manufacturing, Vol. 5, No. 4, November 1992, pp. 368-372.
• Shahin Sharifzadeh, James R. Koehler, Art B. Owen, and John D. Shott, "Using Simulators to Model Transmitted Variability in IC Manufacturing", IEEE Transactions on Semiconductor Manufacturing, Vol. 2, No. 3, August 1989, pp. 82-93.

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