Click here to go to a list of abstracts for these articles.

• Cunningham, Spanos, and Voros. "Semiconductor Yield Improvement: Results and Best Practices."
• Gibson, Podder, May,and Brooke. "Statistically Based Parametric Yield Prediction for Integrated Circuits."
• Kenny, May, and Hunt. "Yield Modeling of Acoustic Charge Transport Transversal Filters."

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