The SEMI test problem suite consists of 3 instances of a two-stage multi-period stochastic integer program arising in the planning of semiconductor tool purchases. The problem formulation is described in [1]. The instances have mixed-integer first-stage variables and continuous second-stage variables.
DATA:
The SMPS data for the three problem instances are contained in the zip file semi.ZIP. The zip file includes 1 core and 1 time file, and 3 stoch files corresponding to three scenario numbers (2,3,and 4). The size of the deterministic equivalent problem for three instances are tabulated below.
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Problem Scen Cols Int Rows
SEMI2 2 20216 612 11686
SEMI3 3 30018 612 17528
SEMI4 4 39820 612 23370
SOLUTION:
The following table presents the upper and lower bounds obtained using
IBM OSLSE on an IBM Thinkpad Model 770 (with 233 MHz speed
and 256 MB RAM) running Windows NT 4.0.
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Problem UB LB % Gap CPUs Nodes Iter
SEMI2 1545.5 1457.1 6.1 2,164 7,153 93,118
SEMI3 1808.1 1745.4 3.6 8,914 28,410 383,787
SEMI4 2197.2 2148.4 2.3 27,519 61,192 1,125,986
REFERENCES:
[1] F. Barahona, S. Bermon, O. Gunluk, and S.
Hood. "Robust
Capacity Planning in Semiconductor Manufacturing," IBM Research Report
RC22196, 2001.