January 22, 2002

Jye-Chyi (JC) Lu

Professor

School of Industrial and Systems Engineering

 

  1. EARNED DEGREES

    2. Ph.D. 1988 (Statistics) University of Wisconsin

    B.S. 1979 (Applied Mathematics) National Chiao-Tung University, Taiwan, R.O.C.

  2. EMPLOYMENT

    3. 8/99-Present, Professor, School of Industrial and Systems Engineering, Georgia Institute of Technology.

    7/99-8/99 Professor, Department of Statistics, North Carolina State University (NCSU).

    7/94-6/99 Associate Professor, Department of Statistics, NCSU.

    8/88-6/94 Assistant Professor, Department of Statistics, NCSU.

    8/92-8/99 Faculty member of Operations Research, NCSU.

    8/92-8/99 Faculty member of Integrated Manufacturing System Engineering Institute (IMSEI), NCSU.

    8/83-7/88 Instructor, Teaching Assistant, Research Assistant, Department of Statistics, University of Wisconsin, Madison.
  3. TEACHING

A. INDIVIDUAL STUDENT GUIDANCE

Postdoctoral Fellow:

1. Jinho Park (Aug. 1996-July 1997),(Assistant Professor, Statistics at a Korean University).

2. Ming Yin (Aug. 1997-May 1998), (ManTech Consulting company at RTP, NC).

3. Y. Park (Jan. 1998-April 1998), (SAS at RTP, NC).

4. Chin-Shang Li (Aug. 1998-June 1999), (research fellow in the Medical School of the Univ. of Michigan).

5. Di Chen (Aug. 2000-May 2000), (Alventive company).

Major Thesis Advisor for 19 Students.

Ph.D. Students:

Graduated Students:

1. Ellen, O. McSorley: NCSU student graduated 1993. Thesis title "Comparing Experimental Design Plans for Step-Stress Accelerated Life Tests." She is at Glaxo-Wellcome in RTP, NC.

2. Peter, G. Mesenbrink: NCSU student graduated 1995. Thesis title "Modeling Multivariate Zero-Inflated Count Data from Electronic Manufacturing Processes." He is at Ciba-Geigy in New Jersey.

3. Cemal Unal: NCSU student graduated in 1995. Thesis title "Analysis of Highly Fractionated Experiments with Censored Lifetime Data." He is at PPD in RTP, NC.

4. Cheng Su: NCSU student graduated in 1996. Thesis title "Random Coefficient Models with Random Sample Size." He is at Roche Inc. in California.

5. Martha Gardner: NCSU student graduated in 1997. Thesis title "Detecting Process Faults with Spatial Signatures." She is at GE’s research/consulting center, NY.

6. Weixin Zhou: NCSU student graduated in December 1998. Thesis title "Data Compression with A Structured Wavelets Model and Random Scale Generalized Linear Models." He is at a major bank in the Boston area.

7. Stavros Tourkodimitris: NCSU student graduated in August 1999. Thesis title "Asymptotics of Estimates Based on Maximum Likelihood and Estimating Equations Methods." He is at Briskol Meyer Squib.

8. Cindy Green: NCSU student graduated in August 1999. Thesis title "Parametric Maximum Likelihood Method for Analyzing Gap Data." Served as a co-advisor of her thesis research. She is at Duke Hospital.

9. Di Chen: NCSU student graduated in August 1999. Thesis title "Maximum Empirical Likelihood Estimation with Estimating Equations for Censored Survival Data." He is at Alventive (a B2B company).

10. Nianci Gan: NCSU student, finished his degree in December 1999. Thesis title "Theory and Application of Zero-Inflated Models." He is in the Data Mining Department of SAS in Cary, NC.

11. Joel Fenner: NCSU student, finished his degree spring 2000. Thesis title "Modeling Information Flows in Multi-Stage and Distributed Manufacturing Systems." He is now at Intel, Oregon at a R&D job.

12. Eric Grau: NCSU student finished his degree in August 2000. Thesis title "Robust Estimation in the Spatial Time-Series Models." He currently works at the Research Triangle Institute (RTI) at RTP, NC.
    1. Liqiang Yang: NCSU student finished his Ph.D. degree in Fall, 2000. He has accepted an offer from SPSS. His thesis title is "Nonparametric Gap Data Analysis."
    2. Leah Martell: NCSU student finished her Ph.D. degree in Fall, 2000. Currently, she is an instructor in the John Hopkins University. Her thesis title is "Wavelet Model Selection and De-noising for Large Volumes of Data."

Current Students:
    1. M. K. Jeong, ISyE Ph.D. student working on "Information Synthesis for Large Volumes of Manufacturing Data" (Jan. 2000-present).
    2. B. Y. Chang, ISyE Ph.D. student working on "Mining Large Size of Logistics Data" (May 2000-present).
    3. Chayakrit Charoensiriwath, IsyE Ph.D. student working on Service Engineering areas.

M.S. Student with Thesis Requirement

Current Student:

1.Emily Lada: NCSU student, Operations Research Program, completed M.S. degree spring 2000. Thesis title "Synthesizing Large Volumes of Information with Wavelet Transforms." She continues her Ph.D. study at NCSU (May 2000-present).

Ph.D. Committee Member (Minor Advisor in Statistics):

1. Joe C. Davis: NCSU student, Electrical and Computer Engineering. Graduated 1996. Thesis title "Multi-Objective Optimization in Semiconductor Manufacturing Processes." He is at PDF in Texas.

2. Gulser Koksal: NCSU student, Industrial Engineering. Graduated 1997. Thesis title "Quality Improvement in Textile Dying Processes." She is an Assistant Professor at a major university in Turkey.
    1. Eric Rying: NCSU student, Electrical and Computer Engineering. Expected completion spring 2001. Began 8/15/98. Thesis title "Wavelet Neural Networks in Run-to-Run Control for Semiconductor Manufacturing Processes."
    2. Alisa Kongthon. I served as the chairperson in her comprehensive exam committee focused on the information systems engineering area. She passed the exam in Fall, 2000.

Project Advisor for Undergraduate Students:

1.M. Ellenburg and K. Sheffield, winning undergraduate research awards in two Annual NCSU Undergraduate Research Symposiums.

B. OTHER TEACHING ACTIVITIES

Studied and planned curriculum programs in "Information Engineering and E-Business", "Data Mining" and related areas.

Submitted certificate program proposals to GE Foundation and NSF CCLI-EMD program.

Developed courses at NCSU:

ST370, Probability and Statistics for Engineers (Web-based) ST536, Off-line Quality Improvement

ST537, Life-Testing and Reliability

ST591C, Special Topic Course: Industrial Statistics Practicum

ST516/ECE592S: Applications of Statistical Methods in Semiconductor Manufacturing Processes

Guest Instructors for teaching design of experiment in many engineer courses

Developing courses at Georgia Tech:

IsyE 4803 – Introduction to Information Systems Engineering

 

IV. SCHOLARLY ACCOMPLISHMENTS

A. PUBLISHED BOOKS AND PARTS OF BOOKS

1. Davis, J. C., Gyurcsik, R. S., and Lu, J. C. (1993), "Application of Semi-Empirical Model Building to The RTCVD of Polysilicon," in the first version of SEMATECH’s book on Statistics in the semiconductor industry Case Studies of Process/Equipment Characterization, vol. 2, Chapter 4, 202-214.

2. Lu, J. C. (2001), "Methodology of Mining Massive Data Set for Improving Manufacturing Quality/Efficiency," a chapter (pp. 255-288) for the book entitled Data Mining for Design and Manufacturing: Methods and Applications edited by D. Braha as a volume in a series of "Massive Computing" that is organized by James Abello (AT&T Labs Research), Panos Pardalos (Univ. of Florida) and Mauricio Resende (AT&T Labs Research, Kluwer Academic Publishers: New York.

3. Lu, J. C. (2002), "Information Engineering (Industrial)," an invited book chapter (pp. xxx) for 2002 YEARBOOK OF SCIENCE & TECHNOLOGY.

B. REFEREED PUBLICATIONS

Published

4. Lu, J. C. (1989), "Weibull Extensions of the Freund and Marshall-Olkin Bivariate Exponential," IEEE Transaction on Reliability, 38, 5, 615-619.

5. Lu, J. C. and Bhattacharyya, G. K. (1990), "Some New Constructions of Bivariate Weibull Models," Annals of the Institute of Statistical Mathematics, 42, 3, 543-559.

6. Lu, J. C. (1990), "Least Squares Estimation for the Multivariate Weibull Model of Hougaard Based on Accelerated Life Test of System and Component," Communication in Statistics, 19(10), 3725-3739.

7. Lu, J. C. and Bhattacharyya, G. K. (1991), "Inference Procedures for a Bivariate Exponential Model of Gumbel Based on Life Test of System and Components," Journal of Statistical Planning and Inference, 27, 383-396.

8. Lu, J. C. and Bhattacharyya, G. K. (1991), "Inference Procedures for a Bivariate Exponential Model of Gumbel," Statistics and Probability Letters, 12, 37-50.

9. Davis, J.C., Gyurcsik, R. S., Lu, J.C. and Perkins, R. H.(1991), "Applications of Modern Quality Improvement Techniques to Rapid Thermal Processing," Proceedings of the International Society for Optical Engineering (SPIE), Vol. 1595, pp. 39-51.

10. Lu, J. C. (1992), "Effects of Dependence on Modeling System Reliability and Mean Life via a Multivariate Weibull Distribution," Transactions of the Indian Association for Productivity, Quality & Reliability (JIPQR), 17, 1-22.

11. Lu, J. C. (1992), "Bayes Parameter Estimation for the Bivariate Weibull Model of Marshall-Olkin for Censored Data," IEEE Transactions on Reliability, 41, 608-615.

12. Kurker, C. M., Paulos, J. J., Gyurcsik, R. S., and Lu, J. C. (1993), "Hierarchical Yield Estimation of Large Analog Integrated Circuits." IEEE Journal of Solid State Circuits, 28(3), 203-215.

13. Lu, J. C. and Unal, C. (1993), "Process Characterization and Optimization Based on Censored Data From Highly Fractionated Experiments." IEEE Transactions on Reliability, 43(1), 145-155.

14. Overton, M. F., Pratikto, W. A., Lu, J. C., and Fisher, J. S. (1994), "Laboratory Investigation of Dune Strength as a Function of Sand Grain Size and Dune Density," Coastal Engineering, 23, 151-165.

15. Lu, J. C. (1994), "Using Bayesian Highest Probability Density Intervals To Analyze Censored Data Collected From Screening Experiment," Transactions of the Indian Association for Productivity, Quality & Reliability, 19(1), 1-14.

16. Mesenbrink, P., Lu, J. C., McKenzie, R., and Taheri, J. (1994), "Characterization and Optimization of A Wave Soldering Process," Journal of the American Statistical Association, 89, 1209-1217.

17. Liu, S., Lu, J. C., and Unal C. (1996), "Analysis of Bivariate Censored Low Flows," Journal of Hydraulic Engineering, 122(2), 97-103.

18. Brinkley, P. A., Meyer, K., and Lu, J. C. (1996), "Combined GLIM-Nonlinear Programming Approach to Robust Process Design, a Case Study in Circuit Board Quality Improvement," Applied Statistics, 45(1), 99-110.

19. Lu, J. C., and Su, C. (1996), "Statistical Process Adjustment for Batch Production Systems with Delay," Industrial Mathematics, 46(1), 9-31.

20. Lu, J. C. (1996), "Statistics-Aided Batch Compensators for Systems With Delay," Journal of the Indian Association for Productivity, Quality & Reliability, 21(2), 81-107.

21. Davis J. C., Gyurcsik, R. S., Lu, J. C., and Hughes-Oliver J.M. (1996), "A Robust Metric for Measuring Within-Wafer Uniformity." IEEE Transactions on Components, Hybrids and Manufacturing Technology - Part C: Manufacturing, 19(4), 283-289.

22. Lu, J. C., Park, J. and Yang, Q. (1997), "Statistical Inference of a Time-to-Failure Distribution from Linear Degradation Data," Technometrics, 39(4), 391-400.

23. Davis, J. C., Hughes-Oliver J. M., Gyurcsik, R. S., and Lu, J. C. (1997), "Improved Within-Wafer Uniformity Modeling Through the Use of Maximum Likelihood Estimation of the Mean and Covariance Surfaces," Journal of the Electrochemical Society, 143, 3404-3409.

24. Rying, E. A., Gyurcsik, R. S., Lu, J. C., Bilbro, G., Parsons, G., and Sorrell, F. Y. (1997), "Wavelet Analysis of Mass Spectrometry Signals for Transient Event Detection and Run-to-Run Process Control," in Proceedings of the Second International Symposium on Process Control, Diagnostics, and Modeling in Semiconductor Manufacturing, editors: Meyyappan, M., Economou D., J., Bulter, S. W., pp. 37-44.

25. Liu, S., and Lu, J. C., Kolpin, D. W., and Meeker, W. Q. (1997), "Analysis of Environmental Data with Censored Observations," Environmental Science & Technology, 31(12), 3358-3362.

26. Gardner, M. M., Lu, J. C., Gyurcsik, R. S., Wortman, J. J., and Horning, B. E., Heinish, H. H., Rying, E. A., Rao, S., Davis, J. C., and Mozumder, P. K. (1997), "Equipment Fault Detection Using Spatial Signatures," IEEE Transactions on Components, Hybrids and Manufacturing Technology, Part C: Manufacturing, 20(4), 295-304.

27. Lu, J. C. (1997), "A New Plan for Life-Testing Two-Component Parallel Systems," Statistics and Probability Letters, 34(1), 19-32.

28. Hughes-Oliver, J. M., Lu, J. C., Davis, J. C., and Gyurcsik, R. S. (1998), "Achieving Uniformity in a Semiconductor Fabrication Process Using Spatial Modeling," Journal of the American Statistical Association, 93, 36-45.

29. Chen, D., and Lu, J. C. (1998), "The Asymptotics of Maximum Likelihood Estimates of Parameters Based on a Data Type Where Failure and Censoring Times are Dependent," Statistics and Probability Letters, 36, 379-391.

30. Lu, J. C., Holton, W. C., Fenner, J. S., Williams, S. C., Kim, K. W., Hartford A. H., Chen, D., Roze, K., and Littlejohn, M. A., "A New Device Design Methodology," (1998) IEEE Transactions on Electron Devices - Special Issue on Process Integration and Manufacturability, 45(3), 634-642.

31. Koksal, G., Smith, W. A., Fathi, Y., Lu, J. C., and McGregor, R. (1998), "A Case Study in Off-Line Quality Control: Characterization and Optimization of Batch Dyeing Process Design," International Journal of Technology Management, Special Issue on Total Quality Management: Theory and Practice, Vol. 16, 4/5/6, 358-382.

32. Lu, J. C. and Unal C. (1998), "Bayesian Analyses of Censored Data from Industrial Experiments, Part II - Process Characterization and Optimization," Transactions of Indian Association of Productivity, Quality and Reliability, 23(1), 1-23.

33. Chen, D., Lu, J. C., Hughes-Oliver, J. M., and Li, C. S. (1998), "The Asymptotics of Maximum Likelihood Estimation for the Bivariate Exponential of Marshall and Olkin Based on Mixed Bivariate Censored Data," Metrika, 48(2), 109-125.

34. Hughes-Oliver, J. M., Gonzalez-Farias, G., Lu, J. C., and Chen D. (1998), "Parametric Nonstationary Correlation Models," Statistics and Probability Letters, 40(3), 267-278.

35. Li, C. S., Lu, J. C., Park, J., Kim, K. M., Brinkley, P. A., and Peterson, J. (1999), "A Multivariate Zero-Inflated Poisson Distribution and Its Inferences," Technometrics, 41(1), 29-38.

36. Lu, J. C., Liu, S., Yin, M., and Hughes-Oliver, J. M. (1999), "Lowflow Regression Modeling with Bivariate Censored Data," Environmetrics, 10, 125-136.

37. Su, C., Lu, J. C., Chen, D., and Hughes-Oliver, J. M. (1999), "A Linear Random Coefficient Degradation Model with Random Sample Size," Lifetime Data Analysis, 5, 173-183.

38. Chen, D., Li. C. S., Lu, J. C., and Park, J. (2000), "Properties of Parameter Estimation Based on a Nonstandard Data Type from a Nonstandard Distribution," Australian and New Zealand Journal of Statistics, 42(3), 323-336.

39. Rying, E. A., Bilbro, G. L., Ozturk, M. C., Lu, J. C. (2000), "In Situ Selectivity and Thickness Monitoring Based on Quadrupole Mass Spectroscopy During Selective Silicon Epitaxy", in the Proceedings of the 197th Meeting of the Electrochemical Society, Session I1: Rapid Thermal and Other Short-Time Processing Technologies I, Editors: F. Roozeboom, M. C. Ozturk, J.C. Gelpey, K. G., Reid, and D.-L. Kwong, 383-392.

40. Rying, E. A., Bilbro, G. L., Ozturk, M. C., Lu, J. C. (2001), "In Situ Fault Detection and Thickness Monitoring Using Quadrupole Mass Spectroscopy", in the Proceedings of the 199th Meeting of the Electrochemical Society, Session S1I1: Fundamental Gas-Phase and Surface Chemistry of Vapor Deposition II and Process Control.

41. Chen, D., Lu, J. C., X. Huo, and Ming, Y. (2001), "Robust Estimation with Estimating Equations for Nonlinear Random Coefficients Model," Journal of Statistical Planning and Inference,275-292.

Accepted
    1. Lu, J. C., McSorley, E., and Li, C. S. (in press), "Performance of Parameter Estimates in Step-Stress Accelerated Life Tests with Different Sample Sizes," revised paper submitted to IEEE Transactions on Reliability.

43. Lu, J. C., Chen, D., and N. Gan (in press), "Semiparametric Modeling and Estimation with Empirical Likelihood and Estimating Equation," Australian and New Zealand Journal of Statistics (Theory and Methods).
    1. Rying, E. A., Bilbro, G. L., and Lu, J. C. (in press), "Focused Local Learning with Wavelet Neural Networks," IEEE Trans. on Neural Networks.
    2. Lada, E. K., Lu, J. C., and Wilson, J. R. (in press), "A Wavelet Based Procedure for Process Fault Detection," IEEE Trans. on Semiconductor Manufacturing.

46. Porter, A. L., Kongthon, A., and Lu, J. C. (in press), "Research Profiling – Improving the Literature Review: Illustrated for the Case of Data Mining of Large Datasets," Scientometrics.

Invited for Revision

47. Park, J., Kim, K., and Lu, J. C., "Process Change-Point Detection with Zero-Inflated Poisson Models," revised paper submitted to Australian and New Zealand Journal of Statistics (Applications).

    1. OTHER PUBLICATIONS
    1. Lu, J. C., Chen, D., and Zhou, Weixin, "Generalized Linear Models with Random Scales and Integrated Extended Quasi-Likelihood Estimates," submitted to Journal of Statistical Planning and Inference.
    2. Green, C. L., Brownie, C., Boos, D. D., Lu, J. C., Krucoff, M. W., "Maximum Likelihood Estimation of Time to First Event When Data Gaps and Multiple Events are Possible."
    3. Ghosh, S. K., Mukhopadhyay, P., and Lu, J. C., "Bayesian Analysis of Zero-Inflated Regression Models," paper submitted to Applied Statistics.
    4. Rying, E. A., Bilbro, G. L., Ozturk, M. C., and Lu, J. C., "Wavelet-based Selectivity and Thickness Monitoring During Selective Silicon Epitaxy Using Quadrupole Mass Spectrometry," paper submitted to IEEE Trans. on Semiconductor Manufacturing.
    5. Lu, J. C., and Peng, Liang, "Empirical Likelihood Based Confidence Interval for the Tail Index," paper submitted to Extremes.

54. Chen, D., and Lu, J. C., "Asymptotic Distributions of the Semiparametric Maximum Likelihood Estimates with Estimating Equations for Group Censored Data," paper submitted to Annals of Statistical Mathematics.

D. PRESENTATIONS

Here are a few examples of recent presentations.

1. Desai, N. N., and Lu, J. C. (1994), "Statistics-Aided Batch-Compensators on Systems with Possible Non-Instantaneous Responses," student presentation in a National Undergraduate Research Symposium. Paper is published in the conference proceedings.

2. Ellenburg, M. and Lu, J. C. (1997), "Quality Improvement in Printed Circuit Board Manufacturing Processes," student presentation in a Quality and Productivity Conference at Orlando, Florida.

3. Rying, E. A., Gyurcsik, R. S., Lu, J. C., Bilbro, G., Parsons, G., and Sorrell, F. Y. (1997), "Wavelet Analysis of Mass Spectrometry Signals for Transient Event Detection and Run-to-Run Process Control," presentation in a special contributed session of the Joint Meetings of the American Statistical Association.

4. Park, J., Lu, J. C., Chen D., Ghosh, S., Brinkley, P. A., and Peterson, J. (1997), "Multivariate Zero-Inflated Poisson Regression and Its Applications to Equipment Fault Detection," presentation in a special contributed session of the Joint Meetings of the American Statistical Association.

5. Gardner, M. M., Lu, J. C., Davis, J. C., Wu. C. T., Chen, D., Gyurcsik, R. S., and Wortman, J. J. (1997), "Statistical Procedures for Detecting Semiconductor Equipment Problems," presentation in a special contributed session of the Joint Meetings of the American Statistical Association. Several project review reports in this project were presented in Texas Instrument, Inc.

6. Lu, J. C. (1997), "Projects Applying Continuous Quality Improvement Techniques to (Semiconductor Manufacturing) Research Process," invited presentation in the SRC sponsored "The Best Practices Workshop", Duquesne University, Pittsburgh.

7. Grau, E. A. and Lu, J. C. (1998), "Robust Estimation and Outlier Detection in the AR(1)*AR(1) Bilateral Spatial Model," presentation in a special contributed session of the Joint Meetings of the American Statistical Association.

8. Lu, J. C. and his VIGORE Group (1998), "VIGORE ­ Vertical Integration of Outreach, Research and Education Program," Statistics Departmental Seminar, NCSU.

9. Chen, D. and Lu, J. C. (1998), "Statistical Inference of a Time-to-Failure Distribution from Linear Degradation Data," invited presentation in the International Conference in Reliability and Survival Analysis, IL.

10. Lu, J. C. (1998), "Quality Improvement in Multi-Product Electronics Manufacturing," invited plenary presentation in Quality and Productivity Conference, CA (sponsored by University of Berkeley (Departments of Statistics and Industrial Engineering) and HP.

11. Lu, J. C. (1998), "Data Fusion and Corporate Manufacturing," invited plenary presentation in the International Nortel Dependability Conference, Ottawa, Canada.

12. Lu, J. C. (1999), "My Past, Current and Future Research Activities," interview presentation in the School of Industrial and Systems Engineering, Georgia Tech.

13. Martell, L. and Lu, J. C. (1999), "Wavelet Model Selection and De-Noising for Handling Large Volumes of Data," presentation in a contributed session of the Joint Meetings of the American Statistical Association.

14. Martell, L. and Lu, J. C. (1999), "Wavelet Model Selection and De-Noising for Handling Large Volumes of Data," Seminar presentation in the Department of Statistics, NCSU (presented by my student L. Martell).
    1. Lu, J. C. (2000), "Ideas of Constructing an Intelligent Manufacturing System," invited short presentation to JDS Uniphase managers at Bloomfield, CT.
    2. Rying, E. A., Bilbro, G. L., Ozturk, M. C., Lu, J. C. (2000), "In Situ Selectivity and Thickness Monitoring Based on Quadrupole Mass Spectroscopy During Selective Silicon Epitaxy," contributed paper presented in 197th Meeting of the Electrochemical Society, Session I.1: Rapid Thermal and Other Short-Time Processing Technologies 1, May 14-18, 2000 in Toronto, Canada.
    3. Lu, J. C. (2001), "Logistics Data Warehousing and Mining," one-hour lecture presented in the Logistics Short Course sponsored by The Logistics Institute (TLI).
    4. Lu, J. C. (2001), "Gap Data Analysis and Degradation Modeling for Supply Chain Management," invited presentation in the Spring Research Conference on Statistics in Industry and Technology held on June 18-20, Roanoke, VA.

E. OTHER SCHOLARLY ACCOMPLISHMENTS
    1. Software programs (1999): Automatic Data Validation and SPC Charting (came from project sponsored by Bayer).
    2. Software programs (1999): 9-Up Decision Charts: Connecting Material, Manufacturing Operation and Customer Service Databases (came from project sponsored by Nortel).

 

  1. SERVICE

A. PROFESSIONAL CONTRIBUTIONS

1. Associate Editor of IEEE Transactions on Reliability (10/1999 – present).
    1. Organizer and Session Chair for the IMS/ENAR Spring 2001 meeting at Charlotte, NC. The title of our session is "Multiscale Methods in Biometry".
    2. Organizer and Session Chair for the 2001 SPRING RESEARCH CONFERENCE ON STATISTICS IN INDUSTRY AND TECHNOLOGY, June 18-20, 2001 Roanoke, VA, USA.
    3. CIES Fulbright Specialist Review Panelist for Statistics (1999).
    4. Organizer of a special contributed session in 1997 Joint Meetings of the American Statistical Association.
    1. Referee for Annals of Statistics, Technometrics, IEEE Transactions on Semiconductor Manufacturing; External Ph.D. thesis Reviewer for Indian Institute of Technology; Annals of the Institute of Statistical Mathematics; Technometrics; Statistics and Probability Letters; Proceedings of the International Symposium on Multivariate Analysis and Its Applications; International Statistical Review; IEEE Transactions on Reliability; IEEE Transactions on Semiconductor Manufacturing; IEEE Transactions on Components; Hybrids and Manufacturing Technology and Lifetime Data Analysis.

 

    1. CAMPUS CONTRIBUTIONS
    1. Served in three internal review committees for promotion and tenure.
    2. Served in the statistics Ph.D. comprehensive exam committee.

 

C. OTHER CONTRIBUTIONS
    1. Provided consulting services to companies such as Bayer, Nortel and Wake Medical Hospital at Raleigh, NC (1999).
  1. GRANTS AND CONTRACTS
    1. AS PRINCOPAL AND CO-PRINCIPAL INVESTIGATOR

FUNDED PROJECTS:
    1. Year 1995 and before: received several funds from various private companies, Federal and State agencies.

2. Received SRC-AEMP (with Dr. Holton) support $7,118 for 1996 summer salary.

3. Received NSF-AEMP (Center for Advanced Electronic Materials Processing/Dr. Wortman) $23,000 for supporting a student research assistant from 1/1/96 To 12/31/96.

4. Texas Instruments, $25,000 from 3/16/96 to 3/15/96 on "Fault Detection with Spatial Uniformity Signature," co-PI.

5. GE gift donation, $12,000 from 1/1/96 to 5/15/96, sole PI responsible for the donation.

6. Nortel GIT (Switching Division), $55,000 from 1/1/96 to 6/30/96, sole PI.

7. Nortel GIT (Wireless Division), $10,700 from 6/1/96 to 8/15/96, sole PI.

8. Nortel GIT (Switching Division), $40,000 from 7/1/96 to 12/31/96, sole PI.

9. Nortel GIT (Wireless Division), $11,803 from 8/16/96 to 12/31/96, sole PI.

10. Nortel gift donation $6,400 from 7/1/96 to 8/15/96; sole PI.

11. NSF Mathematical Sciences Division (University-Industry Cooperative Research), $64,640 from NSF and $52,000 matching funds from Nortel Wireless Division from 9/16/96 to 9/15/98, "Across-Stage Supervisory Process Control System," PI.

12. GE gift donation $6,000 from 5/16/96 to 9/30/96; Sole PI responsible for this donation.

13. Semiconductor Research Corporation Research Grant, $16,000 from 1/1/97 to 12/31/97, PI.

14. Nortel GIT (Wireless Division), $44,000 from 1/1/97 to 12/31/97, sole PI.

15. Nortel Graduate Industrial Traineeship (GIT) (Switching Division), $103,200 from 1/1/97 to 12/31/97, sole PI.

16. Nortel gift fund donation (1997) $9,480 to the industrial statistics program; sole PI responsible for this gift.

17. Received a $3,000 grant from NCSU (1997) outreach and extension program for developing an industrial statistics outreach program for North Carolina; co-PI.

18. Received a grant with $10,200 (one and half summer salary with benefit) from NCSU (1997)for developing on-line ST370 course; sole PI.

19. Received matching funds $26,000 (1/1/97 to 12/31/97) from Nortel Wireless, RTP for the two-year NSF-Nortel University-Industrial Cooperative Research (postdoctoral fellow support); sole PI.

20. Semiconductor Research Corporation (SRC) (1997), "Research and Student Training in Semiconductor Manufacturing Research," ($45,000 from 5/16/97 to 8/15/97), PI.

21. Nortel Industrial Traineeship (Engineering Division) (1997), "9-Up Decision Charts Automation," ($65,650 From 5/16/97 to 12/31/97), sole PI.

22. NSF DMS (University-Industry Cooperative Research Program) (1997), "Process Design, Modeling, and Optimization in Electronics and Health Care Products," ($70,800 from 6/1/97 to 5/31/98), co-PI.

23. Bayer (1998), "Automation in Data Validation and SPC Charting," ($3,250 from 6/98 – 12/98), sole PI.

24. Nortel Industrial Traineeship (Operation Division) (1998), "Reliability Testing Automation," ($48,000 from 1/1/98 to 6/30/98), sole PI.

25. Nortel Industrial Traineeship (Operation Division) (1998), "Automation in Factory Maintenance Department," ($44,000 from 1/1/98 to 12/31/98), sole PI.

26. Nortel Industrial Traineeship (Engineering Division) (1998), "Quality Improvement in Process and Product Development," ($75,000 from 1/1/98 to 12/31/98), sole PI.

27. Nortel Industrial Traineeship (Engineering Division)(1998), "Factory Automation," $61,000 from 5/1/98 to 12/31/98, sole PI.

28. NSF DMS (University-Industry Cooperative Research Program) (1998), " Statistics in Semiconductor and Electronics Manufacturing Applications," ($69,700 from 6/1/98 to 5/31/99), PI.

29. NSF Division of Mathematical Sciences (DMS) (VIGRE Program Competition) (1999), "A Research Community for Training the Next Generation of Problem Solvers," ($2,746,310 for 5 years), main co-PI.

30. Mathematical Sciences Division in the National Security Agency (NSA) (1999), "Robust Estimation and Outlier Detection for Spatial Lattice Models," ($14,000 for one year), sole PI.

31. JDS Uniphase supports our research and education program on synthesizing large volumes of information from fiber optics manufacturing processes ($41,500 in year 2000).

32. NSF DMS (University-Industry Cooperative Research Program) (1999-2000), "Statistics in Drug Discovery," $38,000 for one year, co-PI, Glaxo-Wellcome provides $40,000 matching fund.
    1. NSF Mathematical Sciences (DMS)(University-Industry Cooperative Research Program) (1999-2000), "Modeling Data from Electronics Manufacturing Processes," $52,765 for one year, PI; Simens provides $35,000 matching funds.
    2. NSF ENG (2001), "Internet Based Curriculum Innovation in Information Engineering and E-Business," $499,994 for three years, main co-PI (Dr. Pritchett in ISyE is the PI).
    3. JDS Uniphase supports our research and education program on eDesign ($9,800 in year 2001).
    4. Center of Paper Business and Industry Studies, "Price Behavior (and Forecasting and Elasticities) in the Pulp and Paper Industry," $237,601 (2001-2003), co-PI (Dr. H. Li served as the PI).
    5. NSF DMII-ORPS Program, "Modeling Accelerated Degradation Data for Product Reliability Improvement and Warranty Analysis," $275,450 for three years, co-PI (Dr. P. Kvam served as PI).

      6.  

      PROPOSALS PENDING:

    6. NSF ITR Program, "ITR-eProduct Design, Manufacturing and Service Chain Management System," $4,964,069 for five years, PI with many co-PIs from GT-MARC, Emory and SUNY-Buffalo.
    7. NSF ITR Program, "ITR Collaborative Proposal: Intelligence Discovery, Synthesis and Sharing in Responding to National Emergencies," $2,902,855, PI with many co-PIs from Emory, GTRI and Oklahoma State University.

VII. HONORS AND AWARDS
    1. Received 1996 David D. Mason Outstanding Faculty Award in the Department of Statistics, NCSU.
    2. Received 1996-97 NCSU PAMS College Outstanding Faculty Outreach Award.
    3. Received 1997-98 North Carolina State University Outstanding Extension Service Award.