Curriculum Vitae for Jye-Chyi (JC) Lu

School of Industrial and Systems Engineering, Campus Box 0205,

Georgia Institute of Technology, Atlanta, GA 30332-0205;

(404) 894 2318;JCLU@isye.gatech.edu; www.isye.gatech.edu/~jclu

I. EARNED DEGREES

Ph.D. in Statistics, August 1988, University of Wisconsin, Madison.

B.S. in Applied Mathematics, May 1979, National Chiao-Tung University at Taiwan.

II. EMPLOYMENT

8/99- Professor, School of Industrial and Systems Engineering, Georgia Institute of Technology.

7/99-8/99 Professor, Department of Statistics, North Carolina State University (NCSU).

7/94-6/99 Associate Professor, Department of Statistics, NCSU.

8/88-6/94 Assistant Professor, Department of Statistics, NCSU.

8/92-8/99 Faculty member of Operations Research, NCSU.

8/92-8/99 Faculty member of Integrated Manufacturing System Engineering Institute (IMSEI), NCSU

8/83-7/88 Instructor, Teaching Assistant, Research Assistant, Department of Statistics, University of Wisconsin, Madison.

III. TEACHING

  1. INDIVIDUAL STUDENT GUIDANCE

Postdoctoal Fellow:

    1. Di Chen (Visiting Faculty at ISYE, Georgia Tech.)
    2. Jinho Park (Assistant Professor of Statistics at a Korea University)
    3. Ming Yin (at ManTech Consulting company, RTP)
    4. Y. Park (at SAS)
    5. Chin-Shang Li (at U. Michigan Medical School).

Major Thesis Advisor for 15 Students.

Ph.D. Students:

Graduated Students:

    1. Nianci Gan: NCSU student finished Ph.D. defense exam in November, 1999; Thesis title: "Theory and Application of Zero-Inflated Models"; Accepted a position at IBM, California.
    2. Di Chen: NCSU student graduated in 8/15/99; "Maximum Empirical Likelihood Estimation with Estimating Equations for Censored Survival Data"; Now, he is a visiting faculty at Georgia Tech.
    3. Cindy Green: NCSU student graduated in 5/15/99; "Parametric Maximum Likelihood Method for Analyzing Gap Data"; I was a co-advisor of her thesis research. Now, She is at Duke Hospital.
    4. Stavros Tourkodimitris: NCSU student graduated in 8/15/99; "Asymptotics of Estimates Based on Maximum Likelihood and Estimating Equations Methods"; Now, he is at Briskol Meyer Squib.
    5. Weixin Zhou: NCSU student graduated in 12/31/98; "Data Compression with A Structured Wavelets Model and Random Scale Generalized Linear Models"; Now, he is at a major bank in the Boston area.
    6. Martha Gardner: NCSU student graduated in 1997; "Detecting Process Faults with Spatial Signatures"; Now, she is at GE’s headquarter research/consulting center, NY.
    7. Cheng Su: NCSU student graduated in 1996; "Random Coefficient Models with Random Sample Size"; Now, he is at Roche Inc., California.
    8. Cemal Unal: NCSU student graduated in 1995; "Analysis of Highly Fractionated Experiments with Censored Lifetime Data"; Now, he is at PPD, RTP, NC.
    9. Peter, G. Mesenbrink: NCSU student graduated in 1995; "Modeling Multivariate Zero-Inflated Count Data from Electronic Manufacturing Processes"; Now, he is at Ciba-Geigy, NJ.
    10. Ellen, O. McSorley: NCSU student graduated in 1993; "Comparing Experimental Design Plans for Step-Stress Accelerated Life Tests"; Now, she is at Glaxo-Wellcome, RTP, NC.

Current Students:
    1. Joel Fenner: NCSU student planning to finish his degree in Spring, 2000. Advisement starts from 8/15/98. His thesis title is "Modeling Information Flows in Multi-Stage and Distributed Manufacturing Systems." Accepted an offer at Intel, Oregon.
    2. Eric Grau: NCSU student planning to finish his degree in Spring, 2000. Advisement starts from 8/15/98. His thesis title is "Robust Estimation in the Spatial Time-Series Models." Currently working at RTI, Inc. at RTP, NC.
    3. Liqiang Yang: NCSU student planning to finish his degree in Spring, 2000. Advisement starts from 8/15/98. His thesis title is "Nonparametric Gap Data Analysis."
    4. Leah Martell: NCSU student planning to take her preliminary oral exam (for the thesis proposal) in Spring 2000 and finishing her degree in December 2000. Advisement starts from 8/15/99. Her thesis title is "Wavelet Model Selection and De-noising for Large Volumes of Data."

      5. M.S. Student with Thesis Requirement:

      Current Student:

    5. Emily Lada: NCSU Operations Research Program student planning to finish her degree in Spring 2000. Advisement starts from 8/15/99. Her thesis title is "Synthesizing Large Volumes of Information with Wavelet Transforms." She will continue on her Ph.D. study at NCSU.
      6.

      Ph.D. Committee Member (Minor Advisor in Statistics):

    6. Eric Rying: NCSU Electrical and Computer Engineering Program student planning to finish his degree in Summer 2000. Advisement starts from 8/15/98. Passed the preliminary oral exam in summer 1999. His thesis title is "Wavelet Neural Networks in Run-to-run Control for Semiconductor Manufacturing Processes."
    7. Joe C. Davis: NCSU Electrical and Computer Engineering Program student; graduated in 1996; His thesis title is "Multi-Objective Optimization in Semiconductor Manufacturing Processes." Now, he is at PDF, Texas.
    8. Gulser Koksal: NCSU Industrial Engineering Program student; graduated in 1997; "Quality Improvement in Textile Dying Processes." Now, he is an Assistant Professor in an university at Turkey.

Project Advisor for Undergraduate Students:

Advise M. Ellenburg and K. Sheffield to won undergraduate research award in two different Annual NCSU Undergraduate Research Symposiums.
  1. OTHER TEACHING ACTIVITIES

Take initiatives to study and plan curriculum programs in "Information Engineering and E-Business" related areas.

Taught ISyE 3039 Section B, Quality Improvement Methods. The score of the question #24 in the online survey of the student teaching evaluation is 4.1.

Developed courses at NCSU:

ST370, Probability and Statistics for Engineers (Web-based), ST536, Off-line Quality Improvement,

ST537, Life-Testing and Reliability,

ST591C, Special Topic Course: Industrial Statistics Practicum,

ST516/ECE592S: Applications of Statistical Methods in Semiconductor Manufacturing Processes,

Guest Instructors for teaching design of experiment to many engineer students.

 

IV. SCHOLARLY ACCOMPLISHMENTS

  1. PUBLISHED BOOKS AND PARTS OF BOOKS:

    2. 1. Davis, J. C., Gyurcsik, R. S., and Lu, J. C. (1993), "Application of Semi-Empirical Model Building to The RTCVD of Polysilicon," in the first version of SEMATECH’s book on Statistics in the semiconductor industry Case Studies of Process/Equipment Characterization, vol. 2, Chapter 4, 202-214.

  2. REFEREED PUBLICATIONS

JOURNAL ARTICLES:

2. Lu, J. C. (1989), "Weibull Extensions of the Freund and Marshall-Olkin Bivariate Exponential," IEEE Transaction on Reliability, 38, 5, 615-619.

3. Lu, J. C. and Bhattacharyya, G. K. (1990), "Some New Constructions of Bivariate Weibull Models," Annals of the Institute of Statistical Mathematics, 42, 3, 543-559.

4. Lu, J. C. (1990), "Least Squares Estimation for the Multivariate Weibull Model of Hougaard Based on Accelerated Life Test of System and Component," Communication in Statistics, 19(10), 3725-3739.

5. Lu, J. C. and Bhattacharyya, G. K. (1991), "Inference Procedures for A Bivariate Exponential Model of Gumbel Based on Life Test of System and Components," Journal of Statistical Planning and Inference, 27, 383-396.

6. Lu, J. C. and Bhattacharyya, G. K. (1991), "Inference Procedures for A Bivariate Exponential Model of Gumbel," Statistics and Probability Letters, 12, 37-50.

7. Lu, J. C. (1992), "Effects of Dependence on Modeling System Reliability and Mean Life via a Multivariate Weibull Distribution," Transactions of the Indian Association for Productivity, Quality & Reliability (JIPQR), 17, 1-22.

8. Lu, J. C. (1992), "Bayes Parameter Estimation for the Bivariate Weibull Model of Marshall-Olkin for Censored Data," IEEE Transactions on Reliability, 41, 608-615.

9. Kurker, C. M., Paulos, J. J., Gyurcsik, R. S., and Lu, J. C. (1993), "Hierarchical Yield Estimation of Large Analog Integrated Circuits." IEEE Journal of Solid State Circuits, 28(3), 203-215.

10. Lu, J. C. and Unal, C. (1993), "Process Characterization and Optimization Based on Censored Data From Highly Fractionated Experiments." IEEE Transactions on Reliability, 43(1), 145-155.

11. Overton, M. F., Pratikto, W. A., Lu, J. C., and Fisher, J. S. (1994),"Laboratory Investigation of Dune Strength as A Function of Sand Grain Size And Dune Density," Coastal Engineering, 23, 151-165.

12. Lu, J. C. (1994), "Using Bayesian Highest Probability Density Intervals To Analyze Censored Data Collected From Screening Experiment," Transactions of the Indian Association for Productivity, Quality & Reliability, 19(1), 1-14.

13. Mesenbrink, P., Lu, J. C., McKenzie, R., and Taheri, J. (1994), "Characterization and Optimization of A Wave Soldering Process," Journal of the American Statistical Association, 89, 1209-1217.

14. Liu, S., Lu, J. C., and Unal C. (1996), "Analysis of Bivariate Censored Low Flows," Journal of Hydraulic Engineering, 122(2), 97-103.

15. Brinkley, P. A., Meyer, K., and Lu, J. C. (1996), "Combined GLIM-Nonlinear Programming Approach to Robust Process Design A Case Study in Circuit Board Quality Improvement," Applied Statistics, 45(1), 99-110.

16. Lu, J. C., and Su, C. (1996), "Statistical Process Adjustment for Batch Production Systems with Delay," Industrial Mathematics, 46(1), 9-31.

17. Lu, J. C. (1996), "Statistics-Aided Batch Compensators For Systems With Delay," Journal of the Indian Association for Productivity, Quality & Reliability, 21(2), 81-107.

18. Davis J. C., Gyurcsik, R. S., Lu, J. C., and Hughes-Oliver J.M. (1996), "A Robust Metric for Measuring Within-Wafer Uniformity." IEEE Transactions on Components, Hybrids and Manufacturing Technology - Part C: Manufacturing, 19(4), 283-289.

19. Lu, J. C., Park, J. and Yang, Q. (1997), "Statistical Inference of a Time-to-Failure Distribution From Linear Degradation Data," Technometrics, 39(4), 391-400.

20. Davis, J. C., Hughes-Oliver J. M., Gyurcsik, R. S., and Lu, J. C. (1997), "Improved Within-Wafer Uniformity Modeling Through the Use of Maximum Likelihood Estimation of the Mean and Covariance Surfaces," Journal of the Electrochemical Society, 143, 3404-3409.

21. Liu, S., and Lu, J. C., Kolpin, D. W., and Meeker, W. Q. (1997), "Analysis of Environmental Data with Censored Observations," Environmental Science & Technology, 31(12), 3358-3362.

22. Gardner, M. M., Lu, J. C., Gyurcsik, R. S., Wortman, J. J., and Horning, B. E., Heinish, H. H., Rying, E. A., Rao, S., Davis, J. C., and Mozumder, P. K. (1997) "Equipment Fault Detection Using Spatial Signatures," IEEE Transactions on Components, Hybrids and Manufacturing Technology, Part C: Manufacturing, 20(4), 295-304.

23. Lu, J. C. (1997), "A New Plan for Life-Testing Two-Component Parallel Systems," Statistics and Probability Letters, 34(1), 19-32.

24. Hughes-Oliver, J. M., Lu, J. C., Davis, J. C., and Gyurcsik, R. S. (1998), "Achieving Uniformity in A Semiconductor Fabrication Process Using Spatial Modeling," Journal of the American Statistical Association, 93, 36-45.

25. Chen, D., and Lu, J. C. (1998), "The Asymptotics of Maximum Likelihood Estimates of Parameters Based on A Data Type Where Failure and Censoring Times are Dependent," Statistics and Probability Letters, 36, 379-391.

26. Lu, J. C., Holton, W. C., Fenner, J. S., Williams, S. C., Kim, K. W., Hartford A. H., Chen, D., Roze, K., and Littlejohn, M. A., "A New Device Design Methodology," (1998) IEEE Trans. on Electron Devices - Special Issue on Process Integration and Manufacturability, 45(3), 634-642.

27. Koksal, G., Smith, W. A., Fathi, Y., Lu, J. C., and McGregor, R. (1998), "A Case Study in Off-Line Quality Control: Characterization and Optimization of Batch Dyeing Process Design," International Journal of Technology Management, Special Issue on Total Quality Management: Theory and Practice, Vol. 16, 4/5/6, 358-382.

28. Lu, J. C. and Unal C. (1998), "Bayesian Analyses of Censored Data from Industrial Experiments, Part II - Process Characterization and Optimization," Transactions of Indian Association of Productivity, Quality and Reliability, 23(1), 1-23.

29. Chen, D., Lu, J. C., Hughes-Oliver, J. M., and Li, C. S. (1998), "The Asymptotics of Maximum Likelihood Estimation for the Bivariate Exponential of Marshall and Olkin Based on Mixed Bivariate Censored Data," Metrika, 48(2), 109-125.

30. Hughes-Oliver, J. M., Gonzalez-Farias, G., Lu, J. C., and Chen D. (1998), "Parametric Nonstationary Correlation Models," Statistics and Probability Letters, 40(3), 267-278.

31. Li, C. S., Lu, J. C., Park, J., Kim, K. M., Brinkley, P. A., and Peterson, J. (1999), "A Multivariate Zero-inflated Poisson Distribution and Its Inferences," Technometrics, 41(1), 29-38.

32. Lu, J. C., Liu, S., Yin, M., and Hughes-Oliver, J. M. (1999), "Lowflow Regression Modeling with Bivariate Censored Data," Environmetrics, 10, 125-136.

33. Su, C., Lu, J. C., Chen, D., and Hughes-Oliver, J. M. (1999), "A Linear Random Coefficient Degradation Model with Random Sample Size," Lifetime Data Analysis, 5, 173-183.

REFEREED PROCEEDINGS:

34. Davis, J.C., Gyurcsik, R. S., Lu, J.C. and Perkins, R. H.(1991), "Applications of Modern Quality Improvement Techniques to Rapid Thermal Processing," Proceedings of the International Society for Optical Engineering (SPIE), Vol. 1595, pp. 39-51.

35. Rying, E. A., Gyurcsik, R. S., Lu, J. C., Bilbro, G., Parsons, G., and Sorrell, F. Y. (1997), "Wavelet Analysis of Mass Spectrometry Signals for Transient Event Detection and Run-to-Run Process Control," in Proceedings of the Second International Symposium on Process Control, Diagnostics, and Modeling in Semiconductor Manufacturing, editors: Meyyappan, M., Economou D., J., Bulter, S. W., pp. 37-44.

 

JOURNAL ARTICLE IN PRESS:

36. Chen, D., Li. C. S., Lu, J. C., and Park, J. (in press), "Properties of Parameter Estimation Based on a Nonstandard Data Type from a Nonstandard Distribution," Australian and New Zealand Journal of Statistics.

C. OTHER PUBLICATIONS

MANUSCRIPTS INVITED FOR REVISION:

37. Chen, D., Lu, J. C., X. Huo, and Ming, Y. (1999), "Robust Estimation with Estimating Equations for Nonlinear Random Coefficients Model," revised for Journal of Statistical Planning and Inference.

38. Ghosh, S. K., Mukhopadhyay, P., and Lu, J. C. (1999), "Bayesian Analysis of Zero-Inflated Regression Models," invited for revision to Technometrics.

39. Park, J., Kim, K., and Lu, J. C. (1999), "Process Change-Point Detection with Zero-Inflated Poisson Models," invited for revision to Australian and New Zealand Journal of Statistics (Applications).

MANUSCRIPTS SUBMITTED FOR REVIEW:

40. Peterson, J. P., Lu, J. C., and Li, C. S. (1999), "Polymer Thick Film Ink: Material and Product Reliability Testing."

41. Lu, J. C., McSorley, E., and Li, C. S. (1999), "Performance of Parameter Estimates in Step-Stress Accelerated Life Tests With Different Sample Sizes."

42. Lu, J. C., and Chen, D. (1999), "Application Examples of the Semiparametric Maximum Likelihood Estimate with Estimating Equations."

43. Chen, D., and Lu, J. C. (1999), "Finite and Large Sample Properties of the Semiparametric Maximum Likelihood Estimate with Estimating Equations."

44. Chen, D., and Lu, J. C. (1999), "Asymptotic Distributions of the Semiparametric Maximum Likelihood Estimates with Estimating Equations for Group Censored Data."

 
  1. OTHER PUBLICATIONS: None
  2. PRESENTATIONS
    1. Martell, L. and Lu, J. C. (1999), "Wavelet Model Selection and De-Noising for Handling Large Volumes of Data," (student) Seminar presentation in the Department of Statistics, NCSU.
    2. Martell, L. and Lu, J. C. (1999), "Wavelet Model Selection and De-Noising for Handling Large Volumes of Data," contributed presentation in the Joint Conference of the American Statistical Association.
    3. Lu, J. C. (1999), "My Past, Current and Future Research Activities," interview presentation at the School of Industrial and Systems Engineerging, Georgia Tech.
  1. OTHER SCHOLARLY ACCOMPLISHMENTS
    1. Software programs (1999): Automatic Data Validation and SPC Charting (came from project sponsored by Bayer).
    2. Software programs (1999): 9-Up Decision Charts: Connecting Material, Manufacturing Operation and Customer Service Databases (came from project sponsored by Nortel).

 

V. SERVICE

  1. PROFESSIONAL CONTRIBUTIONS
    1. Associate Editor of IEEE Transactions on Reliability (10/1999 – present).
    2. CIES Fulbright Specialist Review Panelist for Statistics (1999).
    3. Referees for Technometrics, IEEE Transactions on Semiconductor Manufacturing; External Ph.D. thesis Reviewer for Indian Institute of Technology; Due to my busy schedule, I have to turn down several publication reviews.
    4. In the past (before August 1999), I have refereed papers for Annals of the Institute of Statistical Mathematics, Technometrics, Statistics and Probability Letters, Proceedings of the International Symposium on Multivariate Analysis and Its Applications, International Statistical Review, IEEE Transactions on Reliability, IEEE Transactions on Semiconductor Manufacturing, IEEE Transactions on Components, Hybrids and Manufacturing Technology and Lifetime Data Analysis.
  1. CAMPUS CONTRIBUTIONS
    1. Served as Ph.D. committee members for three students in the Department of Electrical and Computer Engineering, NCSU, and as M.S. committee member for one student in the Department of Industrial Engineering, NCSU (1999).
    2. Took leadership in the statistics program at ISYE, Georgia Tech. to (1) initiate faculty recruiting (Dr. Russ Heikes took the lead later on), (2) mentor Dr. Xiaoming Huo, (3) communicate with faculty members in the Paper Science Center, Industrial and Systems Engineering, Mechanical Engineering, Electrical and Computer Engineering, Civil and Environmental Engineering, and the College of Management for joint projects.
  1. OTHER CONTRIBUTIONS
    1. Provided consulting services to companies such as Bayer, Nortel and Wake Medical Hospital at Raleigh, NC (1999).

 

 

VI. GRANTS AND CONTRACTS

  1. AS PRINCOPAL AND CO-PRINCIPAL INVESTIGATOR

PROPOSAL IN PENDING:
    1. NSF ENG DMII-ORPS Program (1999), "Intelligent Wavelet Network for Synthesizing Large Volumes of Information in Operations Management," $159,287 for two years, PI.
    2. Mathematical Sciences Division in the National Security Agency (NSA) (1999), "Statistical Inferences of Semiparametric Likelihood Models with Estimating Equations," ($28,000 for two years), sole PI.
    3. NSF ENG (1999), "A Scalable Intelligent Knowledge and Workflow Management Network for Enterprise-wide Business Automation," $198,304 for one year, PI.
    4. The Procter & Gamble Fund Curriculum Development Grant (2000), "Development of Courses in the Information Engineering and E-business Areas," $149,052 for three years, sole PI.
    5. NSF ENG (2000), "Internet Based Curriculum Innovation in Information Engineering and E-Business," $499,994 for three years, main co-PI.

FUNDED PROJECTS:
    1. NSF Mathematical Sciences (DMS)(University-Industry Cooperative Research Program) (1999-2000), "Modeling Data from Electronics Manufacturing Processes," $52,765 for one year, co-PI.
    2. NSF DMS (University-Industry Cooperative Research Program) (1999-2000), "Statistics in Drug Discovery," $88,217 for one year, co-PI (NSF will cut Georgia Tech.’s subcontract to NCSU entirely).

3. Mathematical Sciences Division in the National Security Agency (NSA) (1999), "Robust Estimation and Outlier Detection for Spatial Lattice Models," ($14,000 for one year), sole PI.

4. NSF Division of Mathematical Sciences (DMS) (VIGRE Prorgam Competition) (1999), "A Research Community for Training the Next Generation of Problem Solvers," ($2,746,310 for 5 years), main Co-PI.

5. NSF DMS (University-Industry Cooperative Research Program) (1998), " Statistics in Semiconductor and Electronics Manufacturing Applications," ($69,700 from 6/1/98 to 5/31/99), PI.

6. Nortel Industrial Traineeship (Engineering Division)(1998), "Factory Automation," ($61,000 from 5/1/98 to 12/31/98), sole PI.

7. Nortel Industrial Traineeship (Engineering Division) (1998), "Quality Improvement in Process and Product Development," ($75,000 from 1/1/98 to 12/31/98), sole PI.

8. Nortel Industrial Traineeship (Operation Division) (1998), "Automation in Factory Maintenance Department," ($44,000 from 1/1/98 to 12/31/98), sole PI.

9. Nortel Industrial Traineeship (Operation Division) (1998), "Reliability Testing Automation," ($48,000 from 1/1/98 to 6/30/98), sole PI.

10. Bayer (1998), "Automation in Data Validation and SPC Charting," ($3,250 from 6/98 – 12/98), sole PI.

11. NSF DMS (University-Industry Cooperative Research Program) (1997), "Process Design, Modeling, and Optimization in Electronics and Health Care Products," ($70,800 from 6/1/97 to 5/31/98), co-PI.

12. Nortel Industrial Traineeship (Engineering Division) (1997), "9-Up Decision Charts Automation," ($65,650 From 5/16/97 to 12/31/97), sole PI.

13. Semiconductor Research Corporation (SRC) (1997), "Research and Student Training in Semiconductor Manufacturing Research," ($45,000 from 5/16/97 to 8/15/97), PI.

14. Received matching funds $26,000 (1/1/97 to 12/31/97) from Nortel Wireless, RTP for the two-year NSF-Nortel University-Industrial Cooperative Research (postdoctoral fellow support); sole PI.

15. Received a grant with $10,200 (one and half summer salary with benefit) from NCSU for developing on-line ST370 course; sole PI.

16. Received a grant $3,000 from NCSU outreach and extension program for developing an industrial statistics outreach program for North Carolina; co-PI.

17. Received Nortel gift fund donation $9,480 to the industrial statistics program; sole PI responsible for this gift.

18. Nortel Graduate Industrial Traineeship (GIT) (Switching Division), $103,200 from 1/1/97 to 12/31/97, sole PI.

19. Nortel GIT (Wireless Division), $44,000 from 1/1/97 to 12/31/97; sole PI.

20. Semiconductor Research Corporation Research Grant, $16,000 from 1/1/97 to 12/31/97, PI.

21. GE gift donation $6,000 from 5/16/96 to 9/30/96; Sole PI responsible for this donation.
    1. NSF Mathematical Sciences Division (University-Industry Cooperative Research), $64,640 from NSF and $52,000 matching funds from Nortel Wireless Division from 9/16/96 to 9/15/98, "Across-Stage Supervisory Process Control System," PI.
    2. Nortel gift donation $6,400 from 7/1/96 to 8/15/96; sole PI responsible for this gift.

24. Nortel GIT (Wireless Division), $11,803 from 8/16/96 to 12/31/96, sole PI.

25. Nortel GIT (Switching Division), $40,000 from 7/1/96 to 12/31/96, sole PI.

26. Nortel GIT (Wireless Division), $10,700 from 6/1/96 to 8/15/96, sole PI.

27. Nortel GIT (Switching Division), $55,000 from 1/1/96 to 6/30/96, sole PI.

28. GE gift donation, $12,000 from 1/1/96 to 5/15/96, sole PI responsible for the donation.

29. Texas Instruments, $25,000 from 3/16/96 to 3/15/96 on "Fault Detection with Spatial Uniformity Signature," co-PI.

30. Received NSF-AEMP (Center for Advanced Electronic Materials Processing/Dr. Wortman) $23,000 for supporting a student research assistant from 1/1/96 To 12/31/96.
    1. Received SRC-AEMP (with Dr. Holton) support $7,118 for 1996 summer salary.
    2. Year 1995 and before: received several funds from various private companies, Federal and State agencies.
  1. AS INVESTIGATOR: None

 

VII. HONORS AND AWARDS
    1. Received 1996 David D. Mason Outstanding Faculty Award in the Department of Statistics, NCSU
    2. Received 1996-7 NCSU PAMS College Outstanding Faculty Outreach Award
    3. Received 1997-8 North Carolina State University Outstanding Extension Service Award
    4. Nominated as a candidate of the Chair of the Engineering and Physical Science Committee of the American Statistical Association Annual Joint Meetings.

 

Note: The underline indicates the accomplishment in 01/01/99 – 12/31/99 and the yellow highlighted underline indicates the accomplishment in 08/16/99 – 12/31/99 at Georgia Tech.