Curriculum Vitae for Jye-Chyi (JC) Lu
School of Industrial and Systems Engineering, Campus Box 0205, Georgia Institute of Technology, Atlanta, GA 30332-0205; (404) 894-2318; JCLU@isye.gatech.edu; www.isye.gatech.edu/~jclu
EDUCATION
Ph.D. in Statistics, August 1988, University of Wisconsin, Madison.
B.S. in Applied Mathematics, May 1979, National Chiao-Tung University at Taiwan.
EMPLOYMENT
8/99- Professor, School of Industrial and Systems Engineering, Georgia Institute of Technology.
7/99-8/99 Professor, Department of Statistics, NCSU.
7/94-6/99 Associate Professor, Department of Statistics, NCSU.
8/88-6/94 Assistant Professor, Department of Statistics, NCSU.
8/92-pres Faculty member of Operations Research, NCSU.
8/92-pres Faculty member of Integrated Manufacturing System Engineering Institute (IMSEI), NCSU
8/83-7/88 Instructor, Teaching Assistant, Research Assistant, Department of Statistics, University of Wisconsin, Madison.
AWARDS AND HONORS
Received 1996 David D. Mason Outstanding Faculty Award
Received 1996-7 NCSU PAMS College Outstanding Faculty Outreach Award
1998-9 CIES Fulbright Specialist Review Panelist for Statistics
Received 1997-8 North Carolina State University Outstanding Extension Service Award
TEACHING
Courses Taught and Developed
Undergraduate:
ST361, Introduction to Statistics for Engineers,
ST370, Probability and Statistics for Engineers (Web-based Section),
ST371, Introduction to Probability and Distribution Theory,
ST372, Introduction to Statistical Inference and Regression,
ST431, Introduction to Experimental Design,
ST435, Statistical Methods for Quality and Productivity Improvement,
Graduate:
ST535, Statistical Process Control,
ST536, Off-line Quality Improvement,
ST537, Life-Testing and Reliability,
ST591, Special Topic Course: Application of Statistical Methods to Quality and Reliability Improvement,
ST591C, Special Topic Course: Industrial Statistics Practicum,
Developed a new version of ST516 (or ST536 in Spring 1997)/ECE592S: Applications of Statistical Methods in Semiconductor Manufacturing Processes.
Guest Instructor for Teaching Design of Experiment to Engineers.
Postdoctoral Fellows:
(1) Jinho Park (Assistant Professor of Statistics at an Korea University); (2) Ming Yin (at ManTech Consulting company, RTP); (3) Y. Park (for two months only; at SAS now); (4) Chin-Shang Li (at U. Michigan now).
Ph.D. Graduates:
(1) McSorley, E. O. (1993; at Glaxo, RTP); (2) Mesenbrink, P. G. (1995; at Ciba-Geigy, NJ); (3) Unal C. (1995; at PPD, RTP); (4) Cheng Su (1996; at Roche, CA); (5) Martha Gardner (1997; at GE, headquarter research/consulting center, NY); (6) Weixin Zhou (1999; at a major bank in Boston area); (7) Stavros Tourkodimitris (1999; got an offer from Briskol Meyer Squib).
Current Ph.D. Students:
(0) Weixin Zhou (just graduated); Statistical Information Technology - Data Compression with A Structured Wavelets Model; Random Scale Generalized Linear Models, (1) Stavros Tourkodimitris (just graduated); Asymptotics of Estimates Based on Maximum Likelihood and Estimating Equations Methods, (2) Di Chen (just graduated); Maximum Empirical Likelihood Estimation with Estimating Equations for Censored Survival Data, (3) Eric A. Grau (expected August, 1999); Robust Estimation in Spatial Time Series Models, (4) Joel S. Fenner (expected December 1999); Statistical and Automatic Process Control for Across-Stage Processes at Distributed Sites, (5) Nianci Gan (expected December 1999); Multivariate Zero-Inflated Poisson Regression; Maximum Empirical Likelihood Estimation for Regression Problems, (6) Liqiang Yang (expected May, 2000); Nonparametric Analysis of Gap Data; (7) Leah Martell (at her preliminary exam stage).
Current M.S. Student working on Thesis:
(1) Emily Lada (in OR program; expected May, 1999); Equipment and Process Fault Detection with Compressed Data from Wavelet Transformations.
Student Awards:
(1) M. Ellenburg and K. Sheffield won undergraduate research award in two different Annual NCSU Undergraduate Research Symposiums; (2) J.S. Fenner was awarded as Burger Fellow by the Semiconductor Research Corporation.
GRANTS AND CONTRACTS
(every item is a separate award at the university office; there are usually several projects involved in one grant or contract; these projects are reviewed by sponsors routinely)
Year 1999:
NSF DMS-VIGRE Proposal (awarded with $2,746,310 for 5 years - subject to the third year review) main Co-PI
NSA Robust Estimation and Outlier Detection for Spatial Lattice Models ($14,000 awarded)
Year 1998:
NSF University-Industry Cooperative Research Program - Statistics in Semiconductor and Electronics Manufacturing Applications (with J.M. Hughes-Oliver, S. Ghosh and W.C. Holton), $69,700 from 6/1/98 to 5/31/99.
Nortel Industrial Traineeship (Factory Automation) $61,000 from 5/1/98 to 12/31/98
Nortel Industrial Traineeship (Process and Product Development Department) $75,000 from 1/1/98 to 12/31/98
Nortel Industrial Traineeship (Factory Maintenance Department) $44,000 from 1/1/98 to 12/31/98
Nortel Industrial Traineeship (Reliability Testing Department) $48,000 from 1/1/98 to 6/30/98
Bayer, $3,250 (develop software for reporting statistical analysis results)
Year 1997:
NSF University-Industry Cooperative Research Program - Process Design, Modeling, and Optimization in Electronics and Health Care Products (with Doug. Nychka) $70,800 from 6/1/97 to 5/31/98.
Nortel Industrial Traineeship (Information Technology Division) $65,650 From 5/16/97 to 12/31/97
Semiconductor Research Corporation Research Grant $45,000 from 5/16/97 to 8/15/97 (with Dennis Maher in Material Engineering)
Received matching fund $26,000 (1/1/97 to 12/31/97) from Nortel Wireless, RTP for the two-year NSF-Nortel University-Industrial Cooperative Research (postdoctoral fellow support).
Received a grant with $10,200 (one and half summer salary with benefit) from NCSU for developing on-line ST370 course.
Received (with Dennis Boos) a grant $3,000 from NCSU outreach and extension program for developing an industrial statistics outreach program for North Carolina.
Received Nortel gift fund donation $9,480 to the industrial statistics program.
Nortel Switching Division Graduate Industrial Traineeship (GIT) $103,200 from 1/1/97 to 12/31/97
Nortel Wireless Division $44,000 from 1/1/97 to 12/31/97
Semiconductor Research Corporation Research Grant $16,000 from 1/1/97 to 12/31/97
Year 1996:
GE donation $6,000 from 5/16/96 to 9/30/96
Joint Grant (with D. D. Boos, B. B. Bhattacharyya and R. S. Gyurcsik) from NSF Mathematical Sciences Division ($64,640) and Nortel Wireless Division ($52,000) from 9/16/96 to 9/15/98 on Across-Stage Supervisory Process Control System.
Nortel donation $6,400 from 7/1/96 to 8/15/96
Nortel Wireless Division GIT $11,803 from 8/16/96 to 12/31/96
Nortel Switching Division Graduate Industrial Traineeship (GIT) $40,000 From 7/1/96 to 12/31/96
Nortel Wireless Division GIT $10,700 from 6/1/96 to 8/15/96
Nortel Switching Division GIT $55,000 from 1/1/96 to 6/30/96
GE donation $12,000 from 1/1/96 to 5/15/96
Texas Instruments (with R. S. Gyurcsik) $25,000 from 3/16/96 to 3/15/96 on Fault Detection with Spatial Uniformity Signature.
Received NSF-AEMP (Center for Advanced Electronic Materials Processing/Dr. Wortman) $23,000 for supporting a student research assistant from 1/1/96 To 12/31/96.
Received SRC-AEMP (with Dr. Holton) support $7,118 for 1996 summer salary.
Year 1995 and Before:
similar funding from many different private companies, Federal and State agencies.
PROFESSIONAL SOCIETY
American Statistical Society
PROFESSIONAL ACTIVITIES
Refereed papers for Annals of the Institute of Statistical Mathematics, Technometrics, Statistics and Probability Letters, Proceedings of the International Symposium on Multivariate Analysis and Its Applications, International Statistical Review, IEEE Transactions on Reliability, IEEE Transactions on Semiconductor Manufacturing, IEEE Transactions on Components, Hybrids and Manufacturing Technology and Lifetime Data Analysis.
Nominated as a candidate of the Chair of the Engineering and Physical Science Committee of the American Statistical Association Annual Joint Meetings.
Associate Editor for IEEE Transactions on Reliability.
PUBLICATIONS
1. Lu, J. C. (1989), "Weibull Extensions of the Freund and Marshall-Olkin Bivariate Exponential," IEEE Transaction on Reliability, 38, 5, 615-619.
2. Lu, J. C. and Bhattacharyya, G. K. (1990), "Some New Constructions of Bivariate Weibull Models," Annals of the Institute of Statistical Mathematics, 42, 3, 543-559.
3. Lu, J. C. (1990), "Least Squares Estimation for the Multivariate Weibull Model of Hougaard Based on Accelerated Life Test of System and Component," Communication in Statistics, 19(10), 3725-3739.
4. Lu, J. C. and Bhattacharyya, G. K. (1991), "Inference Procedures for A Bivariate Exponential Model of Gumbel Based on Life Test of System and Components," Journal of Statistical Planning and Inference, 27, 383-396.
5. Lu, J. C. and Bhattacharyya, G. K. (1991), "Inference Procedures for A Bivariate Exponential Model of Gumbel," Statistics and Probability Letters, 12, 37-50.
6. Lu, J. C. (1992), "Effects of Dependence on Modeling System Reliability and Mean Life via a Multivariate Weibull Distribution," IAPQR Transactions of Journal of the Indian Association for Productivity, Quality & Reliability, 17, 1-22.
7. Lu, J. C. (1992), "Bayes Parameter Estimation for the Bivariate Weibull Model of Marshall-Olkin for Censored Data," IEEE Transactions on Reliability, 41, 608-615.
8. Kurker, C. M., Paulos, J. J., Gyurcsik, R. S., and Lu, J. C. (1993), "Hierarchical Yield Estimation of Large Analog Integrated Circuits." IEEE Journal of Solid State Circuits, 28(3), 203-215.
9. Davis, J. C., Gyurcsik, R. S., and Lu, J. C. (1993), "Application of Semi-Empirical Model Building to The RTCVD of Polysilicon," in the SEMATECH's book on Statistics in the semiconductor industry Case Studies of Process/Equipment Characterization, vol. 2, Chapter 4, 202-214.
10. Lu, J. C. and Unal, C. (1993), "Process Characterization and Optimization Based on Censored Data From Highly Fractionated Experiments." IEEE Transactions on Reliability, 43(1), 145-155.
11. Overton, M. F., Pratikto, W. A., Lu, J. C., and Fisher, J. S. (1994),"Laboratory Investigation of Dune Strength as A Function of Sand Grain Size And Dune Density," Coastal Engineering, 23, 151-165.
12. Lu, J. C. (1994), "Using Bayesian Highest Probability Density Intervals To Analyze Censored Data Collected From Screening Experiment," IAPQR Transactions,Journal of the Indian Association for Productivity, Quality & Reliability, 19(1), 1-14.
13. Mesenbrink, P., Lu, J. C., McKenzie, R., and Taheri, J. (1994), "Characterization and Optimization of A Wave Soldering Process," Journal of the American Statistical Association, 89, 1209-1217.
14. Liu, S., Lu, J. C., and Unal C. (1996), "Analysis of Bivariate Censored Low Flows," Journal of Hydraulic Engineering, 122(2), 97-103.
15. Brinkley, P. A., Meyer, K., and Lu, J. C. (1996), "Combined GLIM-Nonlinear Programming Approach to Robust Process Design A Case Study in Circuit Board Quality Improvement," Applied Statistics, 45(1), 99-110.
16. Lu, J. C., and Su, C. (1996), "Statistical Process Adjustment for Batch Production Systems with Delay," Industrial Mathematics, 46(1), 9-31.
17. Lu, J. C. (1996), "Statistics-Aided Batch Compensators For Systems With Delay," IAPQR Transactions, 21(2), 81-107.
18. Davis J. C., Gyurcsik, R. S., Lu, J. C., and Hughes-Oliver J.M. (1996), "A Robust Metric for Measuring Within-Wafer Uniformity." IEEE Transactions on Components, Hybrids and Manufacturing Technology - Part C, 19(4), 283-289.
19. Lu, J. C., Park, J. and Yang, Q. (1997), "Statistical Inference of a Time-to-Failure Distribution From Linear Degradation Data," Technometrics, 39(4), 391-400.
20. Davis, J. C., Hughes-Oliver J. M., Gyurcsik, R. S., and Lu, J. C. (1997), "Improved Within-Wafer Uniformity Modeling Through the Use of Maximum Likelihood Estimation of the Mean and Covariance Surfaces," Journal of the Electrochemical Society, 143, 3404-3409.
21. Liu, S., and Lu, J. C., Kolpin, D. W., and Meeker, W. Q. (1997), "Analysis of Environmental Data with Censored Observations," Environmental Science & Technology, 31(12), 3358-3362.
22. Gardner, M. M., Lu, J. C., Gyurcsik, R. S., Wortman, J. J., and Horning, B. E., Heinish, H. H., Rying, E. A., Rao, S., Davis, J. C., and Mozumder, P. K. (1997) "Equipment Fault Detection Using Spatial Signatures," IEEE Transactions on Components, Hybrids and Manufacturing Technology, Part C: Manufacturing, 20(4), 295-304.
23. Lu, J. C. (1997), "A New Plan for Life-Testing Two-Component Parallel Systems," Statistics and Probability Letters, 34(1), 19-32.
24. Hughes-Oliver, J. M., Lu, J. C., Davis, J. C., and Gyurcsik, R. S. (1998), "Achieving Uniformity in A Semiconductor Fabrication Process Using Spatial Modeling," Journal of the American Statistical Association, 93, 36-45.
25. Chen, D., and Lu, J. C. (1998), "The Asymptotics of Maximum Likelihood Estimates of Parameters Based on A Data Type Where Failure and Censoring Times are Dependent," Statistics and Probability Letters, 36, 379-391.
26. Lu, J. C., Holton, W. C., Fenner, J. S., Williams, S. C., Kim, K. W., Hartford A. H., Chen, D., Roze, K., and Littlejohn, M. A., "A New Device Design Methodology," (1998) IEEE Trans. on Electron Devices - Special Issue on Process Integration and Manufacturability, 45(3), 634-642.
27. Koksal, G., Smith, W. A., Fathi, Y., Lu, J. C., and McGregor, R. (1998), "A Case Study in Off-Line Quality Control: Characterization and Optimization of Batch Dyeing Process Design," International Journal of Technology Management, Special Issue on Total Quality Management: Theory and Practice, Vol. 16, 4/5/6, 358-382.
28. Lu, J. C. and Unal C. (1998), "Bayesian Analyses of Censored Data from Industrial Experiments, Part II - Process Characterization and Optimization," Transactions of Indian Association of Productivity, Quality and Reliability (IAPQR), 23(1), 1-23.
29. Chen, D., Lu, J. C., Hughes-Oliver, J. M., and Li, C. S. (1998), "The Asymptotics of Maximum Likelihood Estimation for the Bivariate Exponential of Marshall and Olkin Based on Mixed Bivariate Censored Data," Metrika, 48(2), 109-125.
30. Hughes-Oliver, J. M., Gonzalez-Farias, G., Lu, J. C., and Chen D. (1998), "Parametric Nonstationary Correlation Models," Statistics and Probability Letters, 40(3), 267-278.
31. Li, C. S., Lu, J. C., Park, J., Kim, K. M., Brinkley, P. A., and Peterson, J. (1999), "A Multivariate Zero-inflated Poisson Distribution and Its Inferences," Technometrics, 41(1), 29-38.
32. Lu, J. C., Liu, S., Yin, M., and Hughes-Oliver, J. M. (1999), "Lowflow Regression Modeling with Bivariate Censored Data," Environmetrics, 10, 125-136.
33. Su, C., Lu, J. C., Chen, D., and Hughes-Oliver, J. M. (1999), "A Linear Random Coefficient Degradation Model with Random Sample Size," Lifetime Data Analysis, 5, 173-183.
34. Chen, D., Li. C. S., Lu, J. C., and Park, J. (2000), "Properties of Parameter Estimation Based on a Nonstandard Data Type from a Nonstandard Distribution," Australian and New Zealand Journal of Statistics, 42(3), 323-336.
35. Chen, D., Lu, J. C., X. Huo, and Ming, Y. (2001), "Robust Estimation with Estimating Equations for Nonlinear Random Coefficients Model," Journal of the Statistical Planning and Inference, 97, 275-292.
PUBLICATIONS IN PRESS
MANUSCRIPTS INVITED FOR REVISION
36. Ghosh, S. K., Mukhopadhyay, P., and Lu, J. C. (2000), "Bayesian Analysis of Zero-Inflated Regression Models," paper revised for Technometrics.
37. Lu, J. C., McSorley, E., and Li, C. S. (2000), "Performance of Parameter Estimates in Step-Stress Accelerated Life Tests With Different Sample Sizes," paper revised for IEEE Trans. on Reliability.
38. Lu, J. C., Zhou, W., Li, C. S., Hughes-Oliver, J. M., and Ghosh, S. K. (2000), "Process/Equipment Fault Detection and Classification Based on Reduced-size Data Constructed from Structured Wavelet Models," paper in revision for Technometrics.
39. Chen, D., and Lu (2000), "Asymptotic Distributions of Semiparametric Maximum Likelihood Estimates with Estimating Equations for Grouped Censored Data," paper in revision for the Journal of Statistical Planning and Inference.
40. Park, J., Kim, K., and Lu, J. C. (1998), "Process Change-Point Detection with Zero-Inflated Poisson Models," Australian and New Zealand Journal of Statistics (Applications).
REFEREED PROCEEDINGS
41. Davis, J.C., Gyurcsik, R. S., Lu, J.C. and Perkins, R. H.(1991), "Applications of Modern Quality Improvement Techniques to Rapid Thermal Processing," Proceedings of the International Society for Optical Engineering (SPIE), Vol. 1595, pp. 39-51.
42. Rying, E. A., Gyurcsik, R. S., Lu, J. C., Bilbro, G., Parsons, G., and Sorrell, F. Y. (1997), "Wavelet Analysis of Mass Spectrometry Signals for Transient Event Detection and Run-to-Run Process Control," in Proceedings of the Second International Symposium on Process Control, Diagnostics, and Modeling in Semiconductor Manufacturing," editors: Meyyappan, M., Economou D., J., Bulter, S. W., pp. 37-44.
MANUSCRIPTS SUBMITTED FOR REVIEW
43. Grau, E. A., Lu, J. C., and Park, Y. (1999), "Robust Estimates in A Spatial Time Series Model."
44. Lu, J. C., and Chen, D. (1999), "Semiparametric Modeling and Estimation with Empirical Likelihood and Estimating Equation."
Many other Proceedings and invited presentations.